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Other articles related with "test pattern"：
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78501 |
Yin-Yong Luo(罗尹虹), Feng-Qi Zhang(张凤祁), Xiao-Yu Pan(潘霄宇), Hong-Xia Guo(郭红霞), Yuan-Ming Wang(王圆明) |
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Dependence of single event upsets sensitivity of low energy proton on test factors in 65 nm SRAM |
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Chin. Phys. B
2018 Vol.27 (7): 78501-078501
[Abstract]
(504)
[HTML 1 KB]
[PDF 647 KB]
(184)
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